What the measurement provides
- Surface morphology and topography
- Nanoscale structural imaging
- Elemental composition by EDX
- Structural and chemical analysis in a single experiment
Home / Instruments / FE-SEM with EDX
Microscopy & Surface Analysis
Field Emission Scanning Electron Microscopy (FE-SEM with EDX)
High-resolution imaging that uses a focused electron beam to scan a sample surface, producing detailed images of morphology and topography at the nanoscale. Coupled with energy dispersive X-ray spectroscopy (EDX), it also reports elemental composition from characteristic X-rays emitted by the sample.
Sample requirements
- State the nature of the sample (for example hazardous, volatile, or explosive).
- Minimum sample quantity: 0.2 g, in an Eppendorf tube placed in a ziplock bag.
- Only solid, powder, or thin film samples are acceptable.
- Specify main elements for EDX analysis and expected impurities separately on the proforma.
Sample code, chemical composition, and analysis parameters for each sample.