What the measurement provides
- Elemental composition of the near surface
- Oxidation states
- Surface chemistry and bonding environments
- High-resolution scans as requested on the proforma
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Microscopy & Surface Analysis
X-ray Photoelectron Spectroscopy (XPS)
A highly surface-sensitive technique that measures elemental composition and chemical states within the top 1–10 nanometers of a material. The sample is irradiated with X-rays and the kinetic energy of emitted photoelectrons is measured.
Sample requirements
- Check all that apply: non-radioactive, non-explosive, UHV compatible, non-hazardous, non-volatile.
- Thin film dimensions must not exceed 3 mm × 3 mm × 5 mm, preferably on a conductive substrate.
- List elements in the sample and the required high-resolution scans.
- Justify why XPS analysis is needed.
Up to four samples on the official proforma. The document title uses the spelling “Performa”.